eLABa objektas:   "Testinių rinkinių atrinkimo programinės įrangos sudarymas ir tyrimas", 2007,D:20070816:143508-11175
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URL nuoroda http://vddb.laba.lt/obj/LT-eLABa-0001:E.02~2007~D_20070816_143508-11175
Dokumentas Magistro darbas
Prieigos teisės Laisvai prieinamas internete.
Institucija Kauno technologijos universitetas
Mokslo kryptis 09 P - Informatika
Atsakomybė Drovnenkov, Aleksej - Magistro baigiamojo darbo autorius
Stulpinas, Raimundas - Magistro baigiamojo darbo vertinimo komisijos pirmininkas
Motiejūnas, Kęstutis - Magistro baigiamojo darbo vertinimo posėdžio sekretorius
Bareiša, Eduardas - Magistro baigiamojo darbo vertinimo komisijos narys
Butleris, Rimantas - Magistro baigiamojo darbo vertinimo komisijos narys
Kazanavičius, Egidijus - Magistro baigiamojo darbo vertinimo komisijos narys
Tomkevičius, Arūnas - Magistro baigiamojo darbo vertinimo komisijos narys
Šeinauskas, Rimantas - Magistro baigiamojo darbo vertinimo komisijos narys
Štuikys, Vytautas - Magistro baigiamojo darbo vertinimo komisijos narys
Jusas, Vacius - Magistro baigiamojo darbo vadovas
Lenkevičius, Antanas - Magistro baigiamojo darbo recenzentas
Kauno technologijos universitetas - Mokslinį laipsnį teikianti institucija
Antraštė (-ės) Testinių rinkinių atrinkimo programinės įrangos sudarymas ir tyrimas
Construction and research of software for test patterns selection
Santrauka [EN]

Automated test pattern generation (ATPG) problem is being solved for a relatively long time. Its' point is to find optimal test vector sequences, which would cover most of all production-caused digital circuit faults and would run for the minimum amount of time.

One of the ways to test and generate test vectors for digital circuits is functional test method. Its' benefit is that system does not need to be aware of digital circuit's inner logical model, but has to deal only with the input, so that just the ideal model of the digital circuit can be used as a "black box". The program's algorithm can get ideal digital circuit's reaction for corresponding input test vector. This paper will mostly cover functional model approach to ATPG.

This paper covers automated test vector generation software basic theory with brief historical review, comparison of white box and black box models' testing and test vector generation algorithms. Also the software's static structures along with its components, system’s typical use cases are covered. The research part of the paper is focused mostly on the algorithms used, containing research methods which provide the results for the experiment part.

Raktažodžiai: test suites, ATPG, authomated test pattern generation, test vector finding algorithms